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Balancing Positive and Negative Classification Error Rates in Positive-Unlabeled Learning

Neural Information Processing Systems

Positive and Unlabeled (PU) learning is a special case of binary classification with weak supervision, where only positive labeled and unlabeled data are available. Previous studies suggest several specific risk estimators of PU learning such as non-negative PU (nnPU), which are unbiased and consistent with the expected risk of supervised binary classification. In nnPU, the negative-class empirical risk is estimated by positive labeled and unlabeled data with a non-negativity constraint. However, its negative-class empirical risk estimator approaches 0, so the negative class is over-played, resulting in imbalanced error rates between positive and negative classes. To solve this problem, we suppose that the expected risks of the positive-class and negative-class should be close. Accordingly, we constrain that the negative-class empirical risk estimator is lower bounded by the positive-class empirical risk, instead of 0; and also incorporate an explicit equality constraint between them. We suggest a risk estimator of PU learning that balances positive and negative classification error rates, named DC-PU, and suggest an efficient training method for DC-PU based on the augmented Lagrange multiplier framework. We theoretically analyze the estimation error of DC-PU and empirically validate that DC-PU achieves higher accuracy and converges more stable than other risk estimators of PU learning. Additionally, DC-PU also performs competitive accuracy performance with practical PU learning methods.


Balancing Positive and Negative Classification Error Rates in Positive-Unlabeled Learning

Neural Information Processing Systems

Positive and Unlabeled (PU) learning is a special case of binary classification with weak supervision, where only positive labeled and unlabeled data are available. Previous studies suggest several specific risk estimators of PU learning such as non-negative PU (nnPU), which are unbiased and consistent with the expected risk of supervised binary classification. In nnPU, the negative-class empirical risk is estimated by positive labeled and unlabeled data with a non-negativity constraint. However, its negative-class empirical risk estimator approaches 0, so the negative class is over-played, resulting in imbalanced error rates between positive and negative classes. To solve this problem, we suppose that the expected risks of the positive-class and negative-class should be close. Accordingly, we constrain that the negative-class empirical risk estimator is lower bounded by the positive-class empirical risk, instead of 0; and also incorporate an explicit equality constraint between them.








Automatic Piecewise Linear Regression for Predicting Student Learning Satisfaction

arXiv.org Artificial Intelligence

Although student learning satisfaction has been widely studied, modern techniques such as interpretable machine learning and neural networks have not been sufficiently explored. This study demonstrates that a recent model that combines boosting with interpretability, automatic piecewise linear regression(APLR), offers the best fit for predicting learning satisfaction among several state-of-the-art approaches. Through the analysis of APLR's numerical and visual interpretations, students' time management and concentration abilities, perceived helpfulness to classmates, and participation in offline courses have the most significant positive impact on learning satisfaction. Surprisingly, involvement in creative activities did not positively affect learning satisfaction. Moreover, the contributing factors can be interpreted on an individual level, allowing educators to customize instructions according to student profiles.